Sill Optics Trapped Ion Lenses

Sill Optics Trapped Ion Lenses are designed for observation of experiments and applications reliant on trapped ions such as quantum computing and quantum sensing. Designed for ytterbium (Yb+) ion quantum computing, this lens features a high numerical aperture (NA) of 0.4 and a design wavelength of 369nm guaranteeing diffraction-limited imaging of the reflected fluorescence wavelength for sharp focus of a trapped ion. These lenses can be customized for a variety of window thicknesses, wavelength options, working distances, and focal lengths to support unique laboratory environments utilizing ytterbium (Yb+), calcium (Ca+), Berylium (Be+), and Barium (Ba+) ions. Sill Optics Trapped Ion Lenses are specially designed to overcome the limitations imposed on the NA and minimum distance between the lens and the focal plane by vacuum windows up to 2mm thick between the lens and the trapped ion chamber. All optical elements within this trapped ion lens are constructed from fused silica substrates featuring a special low-absorption coating to minimize thermal effects and provide stable and reliable performance.