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TECHSPEC® components are designed, specified, or manufactured by Edmund Optics. TECHSPEC® components are designed, specified, or manufactured by Edmund Optics. Learn More

12.7mm Dia., 1mm Thick, 266nm, Nd:YAG Laser Line Beam Sampler

TECHSPEC® Thin Nd:YAG Laser Line Beam Samplers

TECHSPEC® Thin Nd:YAG Laser Line Beam Samplers

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Stock #29-010 In Stock
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C$211.40
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C$211.40
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C$190.26
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Angle of Incidence (°):
0 ±5
Coating:
Laser V-Coat (266nm)
Design Wavelength DWL (nm):
266
Diameter (mm):
12.70 +0.00/-0.10
Substrate: Many glass manufacturers offer the same material characteristics under different trade names. Learn More
Fused Silica (Corning 7980)
Index of Refraction nd:
1.458
Surface Quality:
20-10
Thickness (mm):
1.00 ±0.10
Type:
Beam Sampler
Coating Specification:
Rabs <0.25% @ 266nm @ 0 ±5° AOI
Clear Aperture (%):
90
Parallelism (arcmin):
<0.50
Damage Threshold, By Design: Damage threshold for optical components varies by substrate material and coating. Click here to learn more about this specification.
3 J/cm2 @ 266nm, 20ns, 20Hz
Transmitted Wavefront Distortion:
0.167 @ 632.8nm

Regulatory Compliance

RoHS:
Certificate of Conformance:

Product Family Description

  • Thin 1mm Design for Space and Weight Constrained Applications
  • Uncoated First Surface Provides Fresnel Reflection
  • AR Coated Second Surface Provides High Transmission
  • High Laser Damage Threshold to Prevent Laser Ablation

TECHSPEC® Thin Nd:YAG Laser Line Beam Samplers are designed to isolate a small portion of incident beams via Fresnel reflection and anti-reflection properties for beam monitoring purposes. These beam samplers are designed with a 1mm thickness to facilitate applications where space and weight constraints are critical. Additionally, an anti-reflection (AR) coating with a high damage threshold on surface two maximizes transmission and reduces ghost reflections. These second surface coated beam samplers are available in laser line coatings including 266nm, 355nm, 532nm, and 1064nm wavelengths. TECHSPEC® Thin Nd:YAG Laser Line Beam Samplers feature a UV Fused Silica substrate which provides excellent transmission from the UV to the IR and a low coefficient of thermal expansion. These beam samplers are ideal for applications where monitoring beam power, wavefront distortion, and optical losses are required.

Note: TECHSPEC® Thin Nd:YAG Laser Line Beam Samplers can be used with Laser Measurement products to monitor beam properties, such as beam power and beam profile, in real time.

Laser Line Beam Sampler
Laser Line Beam Sampler